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CYTUVA

Characterization system of polycrystalline silicon solar wafers and cells through luminescence images using an inGaAs detector

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Contact Information

Basic Information

  • UniversityUniversidad de Valladolid
  • Center
  • DepartmentPhysics of Condensed Matter, Crystallography and Mineralogy
  • Investigation GroupSemiconductor Materials and Nanostructures for Optoelectronics (GdS-Optronlab)


Description

Solar cells exhibit flaws that limit both their efficiency and their lifespan. Using luminescence images, a great deal of sample data can be obtained. This technique was considerably developed in the last years, because it is a non-destructive low-cost method and the required tools are simple. We have developed a compact equipment that facilitates a quick, comfortable and repetitive characterization. Its main purpose is to obtain luminescence (both photo and electroluminescence) images of silicon solar cells and wafers, using a camera equipped with a silicon or an InGaAs sensor. The analysis of the resulting luminescence images allows to characterize the samples according to the number of their flaws.


Other information

Number of researchers:

2

Development status:

In prototype phase

Intellectual Property Rights:

Solicitud de patente

Differentiation in the market:

Quality

Applicability of technology:

No

Companies and markets:

Renewable energies. Solar cells.

Additional Information:

Premio Prometeo 2016 (Award organized by the University of Valladolid).

UNESCO Code:

2211 - Solid state physics

Other members:

Daniel Redondo Hernando

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